Beam Blanking
Ultra high speed (<10nsec RT/FT) unit.
Located very close to the electron source, conjugate to the
focal plane, ensuring
no significant movement during blanking rise/fall cycle.
Provided with micrometer alignment (X/Y) for setting on the
optical axis.
Independently adjusted knife edge for setting the correct
blanking conditions
and ensuring maximum sensitivity.
The blanking voltage enables beam blanking operation to 50kV
with a +5V (minimum)
drive to the plates.
Recommended that impedance matching to either 50-100O is provided
at the column connector to ensure that rise/fall times of
<10nsec
are achieved with normal pulse driven electronics (normally
supplied by user).
CamScan can provide a power pulse amplifier (with no duty
restrictions)
if required.
Beam Current
Stability Module
Enhanced beam stability control
<0.05% / hour maximum drift over a minimum period of 64
hours.
Laser Beam
Locator
A low powered red laser beam, co-axial with the electron optic
axis in the
column, illuminates precisely the centre of the area to be
scanned
by the electron beam.
Beam sensitive or complex large samples can be very easily
positioned
for microscopy and analysis.
Auto Faraday
Cage
Pneumatically controlled turret which, on command, swings
the Faraday
Cage into the electron beam.
Accurate digital read out of probe current displayed on Absorbed
Current
Imaging module.
Particularly useful for probe current measurement during quantitative X-ray microanalysis
without the need to move sample or stage.
Stereo
Optical Microscope
Used in conjunction with the Laser Beam Locator.
Stereoscopic and Vertical Beam observation.
Ideal for inclined viewing of samples set for EDX analysis.
Magnification Range x6.4 to x40.
Continuous zoom x1 to x6.
Complete with High Power automatic illuminator with fibre
optic light guides.
Selected
Area Diffraction
SAD scan coil and electron optic column module to acquire
selected area diffraction
(channelling patterns from areas as small as 10µm
diameter.
The SAD coil is attached to the standard SEM aperture selector
unit.